When using the report statistics command, the number of different types of faults is presented as well as the coverage statistics for the test patterns.

The fault list statistics has two collumns; the uncollapsed and the collapsed faults. The uncollapsed faults are the total number of stuck-at faults for that category. However, several of the faults are equivalent meaning that a test vector that detects one fault will automatically detect another. An example is a stuck at 0 fault on the input of a 2-input ANDgate and a stuck-at 0 fault at the output of the AND Gate.

The rows of the fault list statistics contain several types of faults. The Full class is the total number of faults in the circuit that were added by the add fault commands. The Det_simulation (DS) and Det_implication (DI) are those faults that are detected by the test patterns. Hyp_testable (HYP)refers to faults that require a special setup when detected. Unused faults are output faults that are not connected in the circuit. Redundant faults (RE) are those faults that are not covered by the test pattern because that are redundant logic. Atpg_untestable (AU) refers to faults that are not detected by the test patterns due to rules violations. These faults require intensive checking of the design rules in order to detect.

There are three statistics that are mention in the fault list statistics. Fault coverage is the measure of the number of faults covered divided by the total number of faults. Test coverage is the number of faults detected by the test vectors divided by the total number of faults detected by the test patterns. ATPG effectiveness is the number of faults that comply with the design rules divided by the total number of faults detected by the test patterns.