Fastscan Combinational ATPG
Updated by Ashvitha Kamatala and Samiha Mourad
on Feb. 2, 2001

  1. Fastscan is a program that generate test patterns for combinational circuits and circuit with scan features
  2. Make a subdirectory for your design and write the verilog hdl code in this directory
  3. Fastscan requires a test library. The test library identifies the functions of each part in the design. A test library is given at the end of this page. Cut and paste the test library into a text editor and save it as atglib in the directory you plan to run your project from.

  4.  
  5. Set the mentor graphics working directory to the directory which you plan to execute fastscan from. Make sure you are in this directory when you execute the following shell command:

  6.  

     
     
     

    shell> MGC_PWD=`pwd`

    Note: Apostrophies surround the pwd and not single quotes
    and please, do not leave blank spaces between the words.
     

  7. To invoke Fastscan as a command line interface add the -nogui option as shown the second line

  8.  

     
     
     

    shell >  fastscan <design_name>.v  -verilog -lib atglib
    The following windows will appear

    shell >  fastscan <design_name>.v  -verilog -lib atglib -nogui
     
     

  9. Set the system mode for automatic test pattern generation. This command will also do rule checking to make sure that the scan circuitry you have identified will function correctly.

  10.  

     
     
     

    SETUP> set system mode atpg

  11. If you wish to do IDDQ testing, enter the following command, otherwise skip this step:

  12.  

     
     
     

    ATPG> set fault type IDDQ

  13. Add all the stuck at faults in the circuit. Enter the following command:

  14.  

     
     
     

    ATPG> add faults -all
     

  15. Generate the test vectors by entering the following command:

  16.  

     
     
     

    ATPG> run
     

  17. Check to see how much fault coverage that you received from the patterns. In addition this command will show you how many test vectors were generated.

  18.  

     
     
     

    ATPG> report statistics

    For an explanation of the fault types in report statistics, click here.
     

  19. Next check and see which of the faults are untestable. Enter the following command.

  20. ATPG> report faults -Class UT -all
     
  21. Save the patterns in an ASCII file format by entering the following command:

  22.  

     
     
     

    ATPG> save patterns mux.pats
    Then you can print the file to inspect the patterns
     
     

  23. To terminate the session, at the popup command line, select:

  24.  

     
     
     
     
     

    exit

    or, from the command line, enter:

    ATPG> exit
     



click here to go back to the Index

Test Library


model anotb (OUT, B, A) (

model aorbn (OUT, B, A) ( model dff (QBAR, Q, DATA, CLOCK) ( model dfsc (SCAN, QBAR, Q, DATA1, DATA, CLOCK) ( model dffr (RESET, QBAR, Q, DATA, CLOCK) ( model dfscr (SCAN, RESET, QBAR, Q, DATA1, DATA, CLOCK) ( model dffsr (SET, RESET, QBAR, Q, DATA, CLOCK) ( model dfscsr (SET, SCAN, RESET, QBAR, Q, DATA1, DATA0, CLOCK) ( model inv1 (OUT, IN1) ( model nd2x1 (OUT, IN2, IN1) ( model nd4 (OUT, IN4, IN3, IN2, IN1) ( model ndi2x1 (OUT2, OUT1, IN2, IN1) ( model nr3 (OUT, IN3, IN2, IN1) ( model xor (OUT, IN2, IN1) (